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[IEEE 2008 43rd International Universities Power Engineering Conference (UPEC) - Padova (2008.09.1-2008.09.4)] 2008 43rd International Universities Power Engineering Conference - A novel method based on wavelet threshold de-noising technology and Prony analysis for flicker measurement

โœ Scribed by Youbing Zhang, ; Quan Chen, ; Jianxiong Liu, ; Yi Hu, ; Yijia Cao,


Book ID
121273181
Publisher
IEEE
Year
2008
Weight
225 KB
Category
Article
ISBN
8889884096

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