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[IEEE 2008 37th IEEE Applied Imagery Pattern Recognition Workshop - Washington, DC, USA (2008.10.15-2008.10.17)] 2008 37th IEEE Applied Imagery Pattern Recognition Workshop - Tear-duct detector for identifying left versus right iris images

✍ Scribed by Abiantun, Ramzi; Savvides, Marios

Book ID: 126615941
Publisher: IEEE
Year: 2008
Weight: 553 KB
Category: Article
ISBN: 1424431263
DOI: 10.1109/AIPR.2008.4906437

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