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[IEEE 2008 2nd International Conference on Signals, Circuits and Systems (SCS) - Nabeul, Tunisia (2008.11.7-2008.11.9)] 2008 2nd International Conference on Signals, Circuits and Systems - Multiscale deconvolution using wavelet transform for improving the depth resolution in secondary ion mass spectrometry analysis

✍ Scribed by Boulakroune, M'hamed; Benatia, Djamel; El Oualkadi, Ahmed

Book ID: 120064774
Publisher: IEEE
Year: 2008
Weight: 160 KB
Category: Article
ISBN: 1424426278
DOI: 10.1109/ICSCS.2008.4746882

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