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[IEEE 2008 23rd IEEE/ACM International Conference on Automated Software Engineering - L'Aquila, Italy (2008.09.15-2008.09.19)] 2008 23rd IEEE/ACM International Conference on Automated Software Engineering - Automatic Test Generation for LUSTRE/SCADE Programs

✍ Scribed by Papailiopoulou, Virginia

Book ID: 125517724
Publisher: IEEE
Year: 2008
Weight: 92 KB
Category: Article
ISBN: 142442187X
DOI: 10.1109/ASE.2008.96

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