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[IEEE 2008 15th IEEE International Conference on Image Processing - San Diego, CA, USA (2008.10.12-2008.10.15)] 2008 15th IEEE International Conference on Image Processing - Unifying analysis of full reference image quality assessment

✍ Scribed by Seshadrinathan, Kalpana; Bovik, Alan C.

Book ID: 118173595
Publisher: IEEE
Year: 2008
Weight: 159 KB
Volume: 0
Category: Article
ISBN: 1424417651
DOI: 10.1109/icip.2008.4711976

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