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[IEEE 2008 15th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2008) - St. Julien's, Malta (2008.08.31-2008.09.3)] 2008 15th IEEE International Conference on Electronics, Circuits and Systems - Reliability analysis of logic circuits based on signal probability

✍ Scribed by Franco, Denis Teixeira; Correia Vasconcelos, Mai; Naviner, Lirida; Naviner, Jean-Francois

Book ID: 115446552
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 243 KB
Volume: 0
Category: Article
ISBN: 1424421810
DOI: 10.1109/icecs.2008.4674942

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