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[IEEE 2008 13th International Power Electronics and Motion Control Conference (EPE/PEMC 2008) - Poznan, Poland (2008.09.1-2008.09.3)] 2008 13th International Power Electronics and Motion Control Conference - Measurement of temperature sensitive parameter characteristics of semiconductor silicon and silicon -carbide power devices

✍ Scribed by Nowak, Mietek; Rabkowski, Jacek; Barlik, Roman

Book ID: 120233514
Publisher: IEEE
Year: 2008
Weight: 498 KB
Category: Article
ISBN: 1424417414
DOI: 10.1109/EPEPEMC.2008.4635248

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