𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2007 International Conference on Wavelet Analysis and Pattern Recognition - Beijing, China (2007.11.2-2007.11.4)] 2007 International Conference on Wavelet Analysis and Pattern Recognition - Fault detection and isolation by using multiple model method

✍ Scribed by Xiao-Li Li,

Book ID: 121080596
Publisher: IEEE
Year: 2007
Weight: 358 KB
Category: Article
ISBN: 1424410665
DOI: 10.1109/ICWAPR.2007.4420635

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