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[IEEE 2007 International Conference on Microelectronics - ICM - Cairo, Egypt (2007.12.29-2007.12.31)] 2007 Internatonal Conference on Microelectronics - Integrating SAT with Multiway Decision Graphs for efficient model checking

✍ Scribed by Abed, Sa'ed; Mohamed, Otmane Ait; Zijiang Yang, ; Al Sammane, Ghiath

No coin nor oath required. For personal study only.

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