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[IEEE 2007 IEEE/ACM International Conference on Computer-Aided Design - San Jose, CA, USA (2007.11.4-2007.11.8)] 2007 IEEE/ACM International Conference on Computer-Aided Design - An efficient method to identify critical gates under circuit aging

✍ Scribed by Wenping Wang, ; Zile Wei, ; Shengqi Yang, ; Yu Cao,

Book ID: 121327815
Publisher: IEEE
Year: 2007
Weight: 892 KB
Category: Article
ISBN: 1424413826
ISSN: 1092-3152
DOI: 10.1109/ICCAD.2007.4397353

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