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[IEEE 2007 IEEE/ACM International Conference on Computer-Aided Design - San Jose, CA, USA (2007.11.4-2007.11.8)] 2007 IEEE/ACM International Conference on Computer-Aided Design - Methodology for low power test pattern generation using activity threshold control logic

✍ Scribed by Srivaths Ravi, ; Devanathan, V. R.; Parekhji, Rubin

Book ID: 121257766
Publisher: IEEE
Year: 2007
Weight: 420 KB
Category: Article
ISBN: 1424413826
ISSN: 1092-3152
DOI: 10.1109/ICCAD.2007.4397318

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