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[IEEE 2007 IEEE Power Electronics Specialists Conference - Orlando, FL, USA (2007.06.17-2007.06.21)] 2007 IEEE Power Electronics Specialists Conference - A New Fault Detection Technique for IGBT Based on Gate Voltage Monitoring

โœ Scribed by Rodriguez, M. A.; Claudio, A.; Theilliol, D.; Vela, L. G.


Book ID
115484262
Publisher
IEEE
Year
2007
Tongue
English
Weight
335 KB
Volume
0
Category
Article
ISBN
1424406544

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