𝔖 Bobbio Scriptorium

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[IEEE 2007 IEEE International Symposium on Electromagnetic Compatibility - Honolulu, HI, USA (2007.07.9-2007.07.13)] 2007 IEEE International Symposium on Electromagnetic Compatibility - Logistic Regression in Immunity Testing

✍ Scribed by Giunta, G.; Audone, B.

Book ID: 126708618
Publisher: IEEE
Year: 2007
Weight: 247 KB
Category: Article
ISBN-13: 9781424413508
DOI: 10.1109/ISEMC.2007.52

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