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[IEEE 2007 IEEE International Symposium on Electromagnetic Compatibility - Honolulu, HI, USA (2007.07.9-2007.07.13)] 2007 IEEE International Symposium on Electromagnetic Compatibility - Reduced Order Modeling for Transient Analysis of Carbon Nanotubes Interconnects

✍ Scribed by Antonini, G.; Orlandi, A.

Book ID: 120892993
Publisher: IEEE
Year: 2007
Weight: 216 KB
Category: Article
ISBN-13: 9781424413508
DOI: 10.1109/ISEMC.2007.253

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