[IEEE 2007 IEEE International Symposium on Electromagnetic Compatibility - Honolulu, HI, USA (2007.07.9-2007.07.13)] 2007 IEEE International Symposium on Electromagnetic Compatibility - Simulation and Analysis of EMC Chambers by Ray Tracing Method

✍ Scribed by Lin, Ming-Shing; Ji, Jia-Ming; Hsu, Chung. -I. G.; Hsieh, Han-Chang

• Book ID: 115519327
• Publisher: IEEE
• Year: 2007
• Weight: 348 KB
• Volume: 0
• Category: Article
• ISBN-13: 9781424413508
• DOI: 10.1109/isemc.2007.252