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[IEEE 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - San Francisco, CA, USA (2007.02.11-2007.02.15)] 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - A 20Gb/s Burst-Mode CDR Circuit Using Injection-Locking Technique

✍ Scribed by Lee, Jri; Liu, Mingchung

Book ID: 125846495
Publisher: IEEE
Year: 2007
Weight: 1013 KB
Category: Article
ISBN-13: 9781424408535
DOI: 10.1109/ISSCC.2007.373580

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