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[IEEE 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - San Francisco, CA, USA (2007.02.11-2007.02.15)] 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - A High-Density Subthreshold SRAM with Data-Independent Bitline Leakage and Virtual Ground Replica Scheme

✍ Scribed by Kim, Tae-Hyoung; Liu, Jason; Keane, John; Kim, Chris H.

Book ID: 120647384
Publisher: IEEE
Year: 2007
Weight: 700 KB
Category: Article
ISBN-13: 9781424408535
DOI: 10.1109/ISSCC.2007.373428

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