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[IEEE 2007 IEEE International SOC Conference (SOCC) - Hsin Chu, Taiwan (2007.09.26-2007.09.29)] 2007 IEEE International SOC Conference - An independent-gate FinFET SRAM cell for high data stability and enhanced integration density

✍ Scribed by Zhiyu Liu, ; Tawfik, Sherif A.; Kursun, Volkan

Book ID: 118183996
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 503 KB
Volume: 0
Category: Article
ISBN: 1424415926
DOI: 10.1109/socc.2007.4545427

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