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[IEEE 2007 IEEE International Conference on Industrial Engineering and Engineering Management - Singapore (2007.12.2-2007.12.4)] 2007 IEEE International Conference on Industrial Engineering and Engineering Management - Applying a revised VAM to a multi-level capacitated facility location problem

✍ Scribed by Ying-Yen Chen, ; Hsiao-Fan Wang,

Book ID: 126639046
Publisher: IEEE
Year: 2007
Weight: 436 KB
Category: Article
ISBN: 1424415292
DOI: 10.1109/IEEM.2007.4419207

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