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[IEEE 2007 IEEE International Conference on Industrial Engineering and Engineering Management - Singapore (2007.12.2-2007.12.4)] 2007 IEEE International Conference on Industrial Engineering and Engineering Management - VSSI $\bar X$ control charts for processes with multiple assignable causes

✍ Scribed by Lee, H. J.; Lim, T. J.; Jang, S. C.

Book ID: 118066255
Publisher: IEEE
Year: 2007
Weight: 437 KB
Volume: 0
Category: Article
ISBN: 1424415292
DOI: 10.1109/ieem.2007.4419390

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