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[IEEE 2007 IEEE International Conference on Image Processing - San Antonio, TX, USA (2007.09.16-2007.10.19)] 2007 IEEE International Conference on Image Processing - Tamper Detection Based on Regularity of Wavelet Transform Coefficients

โœ Scribed by Sutcu, Y.; Coskun, B.; Sencar, H.T.; Memon, N.


Book ID
111899081
Publisher
IEEE
Year
2007
Weight
210 KB
Volume
0
Category
Article
ISBN
1424414377

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