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[IEEE 2007 IEEE International Conference on Automation Science and Engineering - Scottsdale, AZ, USA (2007.09.22-2007.09.25)] 2007 IEEE International Conference on Automation Science and Engineering - Approximate Analysis of Re-Entrant Lines with Bernoulli Reliability Models

✍ Scribed by Wang, Chong; Li, Jingshan

Book ID: 126652554
Publisher: IEEE
Year: 2007
Weight: 463 KB
Category: Article
ISBN: 1424411548
DOI: 10.1109/COASE.2007.4341705

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