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[IEEE 2007 IEEE Design and Diagnostics of Electronic Circuits and Systems - Krakow, Poland (2007.04.11-2007.04.13)] 2007 IEEE Design and Diagnostics of Electronic Circuits and Systems - A Low Noise and Low Power CMOS Image Sensor with Pixel-level Correlated Double Sampling

✍ Scribed by Kim, Dongsoo; Han, Gunhee

Book ID: 126652561
Publisher: IEEE
Year: 2007
Weight: 409 KB
Category: Article
ISBN-13: 9781424411610
DOI: 10.1109/DDECS.2007.4295263

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