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[IEEE 2007 IEEE Design and Diagnostics of Electronic Circuits and Systems - Krakow, Poland (2007.04.11-2007.04.13)] 2007 IEEE Design and Diagnostics of Electronic Circuits and Systems - A Heuristic for Concurrent SOC Test Scheduling with Compression and Sharing

โœ Scribed by Larsson, Anders; Larsson, Erik; Eles, Petru; Peng, Zebo


Book ID
120234863
Publisher
IEEE
Year
2007
Tongue
English
Weight
306 KB
Category
Article
ISBN-13
9781424411610

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