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[IEEE 2007 IEEE Compound Semiconductor Integrated Circuits Symposium - Portland, OR, USA (2007.10.14-2007.10.17)] 2007 IEEE Compound Semiconductor Integrated Circuits Symposium - Thermal Properties and Reliability of GaN Microelectronics: Sub-Micron Spatial and Nanosecond Time Resolution Thermography

✍ Scribed by Kuball, Martin; Pomeroy, James W.; Simms, Richard; Riedel, Gernot J.; Ji, Hangfeng; Sarua, Andrei; Uren, Michael J.; Martin, Trevor

Book ID: 126609489
Publisher: IEEE
Year: 2007
Weight: 217 KB
Category: Article
ISBN-13: 9781424410231
DOI: 10.1109/CSICS07.2007.32

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