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[IEEE 2007 IEEE 19th International Conference on Indium Phosphide & Related Materials - Matsue, Japan (2007.05.14-2007.05.18)] 2007 IEEE 19th International Conference on Indium Phosphide & Related Materials - DC and RF Characteristics of 60 nm T-gate MHEMTs with 53% Indium Channel

โœ Scribed by Shim, Jae Yeob; Yoon, Hyung Sup; Kang, Dong Min; Hong, Ju Yeon; Lee, Kyung Ho


Book ID
121302487
Publisher
IEEE
Year
2007
Weight
481 KB
Category
Article
ISBN-13
9781424408757

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