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[IEEE 2007 European Microwave Integrated Circuit Conference - Munich, Germany (2007.10.8-2007.10.10)] 2007 European Microwave Integrated Circuit Conference - Effects of atmosphere on the reliability of RF-MEMS capacitive switches

โœ Scribed by Blondy, Pierre; Crunteanu, Aurelian; Pothier, Arnaud; Tristant, Pascal; Catherinot, Alain; Champeaux, Corinne


Book ID
118132273
Publisher
IEEE
Year
2007
Tongue
French
Weight
82 KB
Volume
0
Category
Article
ISBN
2874870021

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