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[IEEE 2007 8th International Conference on Electronic Measurement and Instruments - Xian, China (2007.08.16-2007.07.18)] 2007 8th International Conference on Electronic Measurement and Instruments - Low Cost Implementation of RF Power Amplifier Testing

✍ Scribed by Sharma, Nitesh Ram; Kee, Lok Teng

Book ID: 118237701
Publisher: IEEE
Year: 2007
Weight: 604 KB
Volume: 0
Category: Article
ISBN: 142441136X
DOI: 10.1109/icemi.2007.4350441

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