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[IEEE 2007 25th International Conference on Computer Design ICCD 2007 - Lake Tahoe, CA, USA (2007.10.7-2007.10.10)] 2007 25th International Conference on Computer Design - Improving the reliability of on-chip L2 cache using redundancy

✍ Scribed by Bhattacharya, K.; Kim, S.; Ranganathan, N.

Book ID: 126717817
Publisher: IEEE
Year: 2007
Weight: 374 KB
Category: Article
ISBN: 1424412579
DOI: 10.1109/ICCD.2007.4601906

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