[IEEE 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop - Monterey, CA, USA (2007.08.26-2007.08.30)] 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop - Reduction of Reset Current in NiO-ReRAM Brought about by Ideal Current Limiter

✍ Scribed by Kinoshita, K.; Tsunoda, K.; Sato, Y.; Noshiro, H.; Yamazaki, Y.; Fukano, T.; Yagaki, S.; Aoki, M.; Sugiyama, Y.

• Book ID: 125451543
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 587 KB
• Category: Article
• ISBN-13: 9781424407521
• DOI: 10.1109/nvsmw.2007.4290583