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[IEEE 2007 18th International Zurich Symposium on Electromagnetic Compatibility - Munich, Germany (2007.09.24-2007.09.28)] 2007 18th International Zurich Symposium on Electromagnetic Compatibility - Modeling of radiated immunity measurements by an active two-port model

✍ Scribed by Buntz, Stefan; Leier, Helmut; Fuchs, Stefan; Gwisdalla, Dieter; Menzel, Wolfgang

Book ID: 125445840
Publisher: IEEE
Year: 2007
Weight: 373 KB
Category: Article
ISBN: 395232860X
DOI: 10.1109/emczur.2007.4388263

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