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[IEEE 2006 International Symposium on Plant Growth Modeling, Simulation, Visualization and Applications (PMA) - Beijing, China (2006.11.13-2006.11.17)] 2006 Second International Symposium on Plant Growth Modeling and Applications - Characterizing Wheat Root Branching Using a Markov Chain Approach

✍ Scribed by Chen, Yan Hua; Zhang, Qian; Li, Bao Guo; Zhang, Bao Gui


Book ID
120193064
Publisher
IEEE
Year
2006
Weight
327 KB
Category
Article
ISBN
0769528511

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