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[IEEE 2006 IEEE Ultrasonics Symposium - Vancouver, BC, Canada (2006.10.2-2006.10.6)] 2006 IEEE Ultrasonics Symposium - P2P-8 Characterization Standard of CMUT Devices Based on Electrical Impedance Measurements

โœ Scribed by Teston, F.; Meynier, C.; Jeanne, E.; Felix, N.; Certon, D.


Book ID
120637898
Publisher
IEEE
Year
2006
Weight
390 KB
Category
Article
ISBN-13
9781424402014

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