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[IEEE 2006 IEEE North-East Workshop on Circuits and Systems - Gatineau, QC, Canada (2006.6.18-2006.6.18)] 2006 IEEE North-East Workshop on Circuits and Systems - A Digital Time Delay Measurement Technique and Phase-Locked Loop Requirements in a Standard CMOS Process

✍ Scribed by Wey, Todd; Young, Brian

Book ID: 120084659
Publisher: IEEE
Year: 2006
Weight: 224 KB
Category: Article
ISBN-13: 9781424404179
DOI: 10.1109/NEWCAS.2006.250964

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