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[IEEE 2006 IEEE International Symposium on Geoscience and Remote Sensing - Denver, CO, USA (2006.07.31-2006.08.4)] 2006 IEEE International Symposium on Geoscience and Remote Sensing - Multivariate Texture Measured by Local Binary Pattern for Multispectral Image Classification

✍ Scribed by Song, C.; Li, P.; Yang, F.

Book ID: 121082621
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 307 KB
Category: Article
ISBN-13: 9780780395107
DOI: 10.1109/IGARSS.2006.555

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