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[IEEE 2006 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - San Francisco, CA (2006.02.6-2006.02.9)] 2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers - A 1ps-Resolution Jitter-Measurement Macro Using Interpolated Jitter Oversampling

✍ Scribed by Nose, K.; Kajita, M.; Mizuno, M.

Book ID: 125885366
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 389 KB
Category: Article
ISBN-13: 9781424400799
DOI: 10.1109/ISSCC.2006.1696271

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