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[IEEE 2006 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - San Francisco, CA (2006.02.6-2006.02.9)] 2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers - A Signal-Integrity Self-Test Concept for Debugging Nanometer CMOS ICs

✍ Scribed by Petrescu, V.; Pelgrom, M.; Veendrick, H.; Pavithran, P.; Wieling, J.

Book ID: 118008961
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 468 KB
Volume: 0
Category: Article
ISBN-13: 9781424400799
DOI: 10.1109/isscc.2006.1696283

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