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[IEEE 2006 IEEE International SOC Conference - Austin, TX (2006.09.24-2006.09.27)] 2006 IEEE International SOC Conference - Method for Managing Electromigration in SOC'S When Designing for Both Reliability and Manufacturing

✍ Scribed by Chow, Karen; Abercrombie, David; Basel, Mark

No coin nor oath required. For personal study only.

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