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[IEEE 2006 IEEE International Conference on Multimedia and Expo - Toronto, ON, Canada (2006.7.9-2006.7.9)] 2006 IEEE International Conference on Multimedia and Expo - Video News Shot Labeling Refinement via Shot Rhythm Models

✍ Scribed by Kender, John; Naphade, Milind

Book ID: 126735878
Publisher: IEEE
Year: 2006
Weight: 210 KB
Category: Article
ISBN-13: 9781424403677
DOI: 10.1109/ICME.2006.262544

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