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[IEEE 2006 IEEE International Conference on Management of Innovation and Technology - Singapore, China (2006.6.21-2006.6.21)] 2006 IEEE International Conference on Management of Innovation and Technology - A Study of Software Fault Detection and Correction Process Models

✍ Scribed by Wu, Y.p.; Hu, Q.p.; Ng, S.h.

Book ID: 127172428
Publisher: IEEE
Year: 2006
Weight: 118 KB
Volume: 2
Category: Article
ISBN-13: 9781424401482
DOI: 10.1109/icmit.2006.262333

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