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[IEEE 2006 IEEE International Conference on Management of Innovation and Technology - Singapore, China (2006.6.21-2006.6.21)] 2006 IEEE International Conference on Management of Innovation and Technology - Understanding Failure Severity in New Product Development Processes of Consumer Electronics Products

✍ Scribed by De Visser, Ilse; Yuan, Lu; Nagappan, Ganesh

Book ID: 126618741
Publisher: IEEE
Year: 2006
Weight: 230 KB
Volume: 2
Category: Article
ISBN-13: 9781424401482
DOI: 10.1109/ICMIT.2006.262283

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