[IEEE 2006 IEEE Instrumentation and Measurement Technology - Sorrento, Italy (2006.04.24-2006.04.27)] 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings - A Software-Based Method for Test Vector Compression in Testing System-on-a-Chip

[IEEE 2006 IEEE Instrumentation and Meas

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[IEEE 2006 IEEE Instrumentation and Meas

✍ Frosio, I.; Stuani, S.; Borghese, N. A. 📂 Article 📅 2006 🏛 IEEE 🌐 English ⚖ 267 KB

[IEEE 2006 IEEE Instrumentation and Meas

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[IEEE 2006 IEEE Instrumentation and Meas

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[IEEE 2006 IEEE Instrumentation and Meas

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[IEEE 2006 IEEE Instrumentation and Meas

✍ Mohan, N. Madhu; Shet, AmolRavikant; Kumar, V. Jagadeesh 📂 Article 📅 2006 🏛 IEEE 🌐 English ⚖ 95 KB