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[IEEE 2006 IEEE Dallas/CAS Workshop on Design, Applications, Integration and Software - Univ. of Texas at Dallas, Richardson, TX, USA (2006.10.29-2006.10.30)] 2006 IEEE Dallas/CAS Workshop on Design, Applications, Integration and Software - Reliable Interconnect Grid for Ultra Deep Submicron

✍ Scribed by Namazi, A.; Nourani, M.; Saquib, M.

Book ID: 120836278
Publisher: IEEE
Year: 2006
Weight: 139 KB
Category: Article
ISBN-13: 9781424406708
DOI: 10.1109/DCAS.2006.321045

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