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[IEEE 2006 European Microwave Integrated Circuits Conference - Manchester, UK (2006.09.10-2006.09.13)] 2006 European Microwave Integrated Circuits Conference - Charge Effects and Transient Simulation of p-HEMT Meander Gate Switches

✍ Scribed by Holm, M.A.; Cameron, N.I.; Brookbanks, D.M.

Book ID: 126710043
Publisher: IEEE
Year: 2006
Weight: 441 KB
Category: Article
ISBN-13: 9782960055184
DOI: 10.1109/EMICC.2006.282658

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