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[IEEE 2006 Design, Automation and Test in Europe - Munich, Germany (2006.3.6-2006.3.10)] Proceedings of the Design Automation & Test in Europe Conference - Temporal Performance Degradation under NBTI: Estimation and Design for Improved Reliability of Nanoscale Circuits

✍ Scribed by Paul, Bipul C. (author);Kang, Kunhyuk (author);Kufluoglu, Haldun (author);Alarn, Muhammad Ashraful (author);Roy, Kaushik (author)

Book ID: 118166159
Publisher: IEEE
Year: 2006
Tongue: German
Weight: 173 KB
Category: Article
ISBN-13: 9783981080117
DOI: 10.1109/date.2006.244119

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