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[IEEE 2006 Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference - Long Beach, CA, USA (2006.05.21-2006.05.26)] 2006 Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference - Determination of Auger upconversion parameter by thermal lens and Z-scan techniques: A comparison

✍ Scribed by Jacinto, C.; Messias, D. N.; Catunda, T.

Book ID: 126468696
Publisher: IEEE
Year: 2006
Weight: 245 KB
Category: Article
ISBN: 1557528136
DOI: 10.1109/CLEO.2006.4628492

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