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[IEEE 2006 Conference on Computer Vision and Pattern Recognition Workshop (CVPRW'06) - New York, NY, USA (17-22 June 2006)] 2006 Conference on Computer Vision and Pattern Recognition Workshop (CVPRW'06) - On the Use of SIFT Features for Face Authentication

✍ Scribed by Bicego, M.; Lagorio, A.; Grosso, E.; Tistarelli, M.

Book ID: 120047363
Publisher: IEEE
Year: 2006
Weight: 591 KB
Category: Article
ISBN-13: 9780769526461
DOI: 10.1109/CVPRW.2006.149

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