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[IEEE 2006 3rd International Conference on Electrical and Electronics Engineering - Veracruz, Mexico (2006.9.6-2006.9.6)] 2006 3rd International Conference on Electrical and Electronics Engineering - Fault diagnosis based on Petri net reduced models

✍ Scribed by Ruiz-Beltran, E.; Lopez-Mellado, E.; Ramirez-Trevino, A.

Book ID: 120010005
Publisher: IEEE
Year: 2006
Weight: 330 KB
Category: Article
ISBN-13: 9781424404032
DOI: 10.1109/ICEEE.2006.251891

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