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[IEEE 2006 22nd IEEE International Conference on Software Maintenance - Philadelphia, PA, USA (2006.9.24-2006.9.24)] 2006 22nd IEEE International Conference on Software Maintenance - An Approach to Test Data Generation for Killing Multiple Mutants

✍ Scribed by Liu, Ming-hao; Gao, You-feng; Shan, Jin-hui; Liu, Jiang-hong; Zhang, Lu; Sun, Jia-su

Book ID: 120734454
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 177 KB
Category: Article
ISBN-13: 9780769523545
DOI: 10.1109/ICSM.2006.13

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