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[IEEE 2006 1ST IEEE International Conference on E-Learning in Industrial Electronics - Hammamet, Tunisia (2006.12.18-2006.12.20)] 2006 1ST IEEE International Conference on E-Learning in Industrial Electronics - Defect Identification Using Artificial Neural Networks And Finite Element Method

✍ Scribed by Hacib, Tarik; Mekideche, M. Rachid; Ferkha, Nassira

Book ID: 126629463
Publisher: IEEE
Year: 2006
Weight: 231 KB
Category: Article
ISBN-13: 9781424403240
DOI: 10.1109/ICELIE.2006.347207

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